Peak channel temperature determination for an AlGaN/GaN HEMT with Raman Thermography and MTTF extraction for long term reliability

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题目: Peak channel temperature determination for an AlGaN/GaN HEMT with Raman Thermography and MTTF extraction for long term reliability
作者: Cristina Miccoli, Leonardo Gervasi, Viviana Cerantonio, James Pomeroy, Martin Kuball, Ferdinando Iucolano
发表年份: 2022
期刊 / 来源: 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
出版社: IEEE
DOI: 10.1109/wipda56483.2022.9955286
文献类型: 学术文献
平台记录更新: 2026-09-03 22:18:46

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